نویسنده = Gholamreza Raisali | ||
تعداد مقالات: 1 | ||
1 | An investigation into the role of LET and supply voltage in determining the critical charge for Single Event Upset in a 65-nm CMOS SRAM | |
Masume Soleimaninia؛ Gholamreza Raisali؛ Amir Moslehi | ||
مشاهده مقاله | اصل مقاله (379.67 K) |