| کلیدواژه ها = | ||
| تعداد مقالات: 1 | ||
| 1 | An investigation into the role of LET and supply voltage in determining the critical charge for Single Event Upset in a 65-nm CMOS SRAM | |
| Masume Soleimaninia، Gholamreza Raisali، Amir Moslehi | ||
| مشاهده مقاله اصل مقاله 379.67 K | ||