Characterization of LiF thin layer by nuclear reaction techniques
، صفحه 0-0 (1)
عنوان دوره: اولین دوره بین المللی و بیست و هشتمین دوره ملی (1400)
نویسندگان
چکیده
In this work the thickness and the stochiometric ratio of a thin LiF target deposited by vacuum evaporation onto self-supporting Ag foil was measured using Elastic Backscattering Spectroscopy (EBS), Particle Induced Gamma-ray Emission (PIGE) and Nuclear Reaction Analysis (NRA) techniques. The gamma-rays and protons were collected by an HPGe detector placed at an angle of 90o with respect to beam direction and an ion implanted Si detector placed at a scattering angle of 165o, respectively. The results of EBS, PIGE and NRA are in good agreement with each other within the estimeted uncertainties. Carbon and Molybdenium contaminations in the target also were examinated by EBS .
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